| 1. | Surface composition analysis method of gold - plated products by edx
黄金制品镀层成分的x射线能谱测量方法 |
| 2. | Fe - sem , edx and xrd indicated that the low - dimensional nanomaterials were wurtzite gan
Fe - sem ， edx和xrd表明三种低维纳米结构均为纤维锌矿gan 。 |
| 3. | Sem , tem , edx , and xps measurements were used to characterize the composition , morphology and structures of the nanowires
利用sem 、 tem 、 edx及xps等测试手段，对样品的成分和结构进行了深入的分析。 |
| 4. | Function s arguments are passed in registers for x86 processors , ecx and edx , and the rest are pushed onto the stack from right to left
函数的一些参数传入寄存器（对于x86处理器，为ecx和edx ） ，而其余的参数按从右向左的顺序入栈。 |
| 5. | The procedure of direct - nitridation in nitrogen and the growth mechanism are analyzed . in the end the direct - nitridation of silicon dioxides in nitrogen is investigated with edx and optical microscopy
从并分析了氮气和硅反应各个阶段的反应过程和机理，得到了氮气不可能直接分解为氮原子，而是通过化学吸附来实现的结论。 |
| 6. | Machining centers nv5000a : mori seiki , other 2 units nc lathes 8 units presses 110t servo press , others 6 units x - ray fluorescence instrument edx - 900hs : shimazu seisakusho : 1 unit clean room 1 unit ultrasonic cleaning devices 3 units others
加工中心5000 ：森精机等2台车床8台轧机110伺服轧机等6台荧光x线分析装置edx 900hs ：岛津制作所无尘室超声波清洗装置3台等 |
| 7. | Dsc , xrd , and edx analysis were adopted to explore the solid - state reaction processing parameters . the results showed that zrnisn - based compounds were synthesized at 1173k with holding for 96 ~ 168hrs , which were also under high purity ar shielding
结果表明：通过固相反应， zrnisn基化合物可以在高纯ar气保护下于1173k保温96 168小时获得：各种组分的产物晶型完整且无杂质相出现。 |
| 8. | Fe - sem , edx , xrd , saed and hrtem indicated that the regular arrays nanorods were wurtzite single crystal gan and the nanorods were tapered from the base to their upper end , which compatible with the theoretical result
Fe - sem ， edx ， xrd ， saed和hrtem结果表明：规则排列的纳米棒是具有六方晶系纤锌矿结构的gan单晶体，并且从西北工业大学博士学位论文底部到顶部具有塔形形貌，这一现象与理论推导结果一致。 |
| 9. | Edx analysis was carried out to obtain additional information about the elemental composition . it revealed an average n content of 19at . % in the samples when c2h8n2 was selected as the nitrogen source , which was obviously higher than that when nrtcl was used ( 1 % )
X -射线能量色散谱仪( edx )对980下制备的样品进行了定量分析，其平均含氮量为19at . ，明显高于以氯化铵为氮源时cn _ x纳米管的含氮量( 1 ) 。 |
| 10. | The obtained thin films were characterized by x - ray diffraction ( xrd ) - 2 scan . sem and edx were used for the films " morphology and compositional analysis . the temperature dependence of the resistance was measured by the standard four - probe technique
运用x射线衍射的- 2扫描对薄膜的相组成进行了分析；采用sem和edx分别对薄膜的表面形貌和成分组成进行了分析；采用标准的四引线法测量了超导薄膜的临界转变温度。 |
