English translation for "open fault"
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- 开口断层
开张断层
张开断层
Related Translations:
- Example Sentences:
| 1. | The stuck - open faults are simulated concurrently based on iddt testing with the test pattern pairs generated above
利用测试生成的向量对，采用瞬态电流测试方法对开路故障进行并发故障模拟。 | | 2. | And through simulative experiments by pspice , the analysis of the test results for short faults , open faults and transistor parameter errors in cmos and bicmos circuits are given
并通过仿真实验,分析了动态电流检测方法对cmos与bicmos电路中短路故障、开路故障、晶体管参数错误的测试情况。 | | 3. | Experimental results show that more than 20 % stuck - open faults in part of is85 and iscas89 circuits can produce 2 . 5 times iddr variation , and then can be detected by iddt testing
实验结果表明，电路中相当一部分故障是i _ ( ddt )可测的。并与以前的自动测试产生算法做了比较，此算法稳定性好、速度快且可测性测度值好。 | | 4. | In application , the test system which is established by the bst controller can test stuck - at faults , open faults and short faults on board , and gives some detail informations
在实际应用中,利用边界扫描控制器构造的测试系统能够实现对电路板的呆滞、开路和短路故障进行有效的检测和诊断,并可提供比较详细的故障诊断信息。 | | 5. | One is hard fault , which means the stuck - open fault and the bridge fault ; another is soft fault , which refers to the component parameters going beyond the preassumed perfomance range . usually , these faults do not lead to a total failure of equipments
一类称之为硬故障,指元件的开路和短路失效故障,另一类称之为软故障,指元件的参数超出预定的容差范围,一般它们均未使设备完全失效。 | | 6. | The stuck - open fault is simulated concurrently using iddt testing with the test pattern pairs generated above . through detaching a pattern pair into two independent patterns , the stuck - at fault are simulated concurrently . simulation results show better fault coverage . the
最后,针对iddt测试的可行性,我们通过利用pspice软件对s208电路中的一些故障做了模拟,这些故障包括开路故障和延时故障。 | | 7. | Based on the analysis and research on fan algorithm , an iddt test pattern generation algorithm for stuck - open faults is present . in the case of ignoring hazards , for the stuck - open faults in cmos circuits , the feasibility of transient current test generation based on fan algorithm is discussed
本文采用启发式搜索的方法，基于对fan算法的分析，在不考虑冒险的情况下对于cmos电路中的开路故障，探讨了利用fan算法进行瞬态电流测试生成的可能性。 | | 8. | There is great change of negative current component when it happens the line - open fault . it is marked as the occurrence of the fault . and it can be concluded the phase characteristic of negative current in the line . in the transient course , there are plenty of harmonics in the fault line . through the transient analysis , it is drawed that the amplitude of each harmonic in fault phase is greater than other phases . harmonic current in fault line is far greater than other normal lines
发生断线故障以后,线路中会出现负序电流的突变,可以作为故障启动判断的标志,并且通过分析得出了故障时负序基波电流的相位特点。在故障暂态过程中,故障电流中含有大量丰富的谐波成分,各次谐波在故障期间有突变,并且衰减很快。 | | 9. | For the convenience of test , varied circuit chip defects caused by the production process are abstracted as all kinds of models . at present the commonly used fault models mainly consist of stuck - at fault , stuck - open fault , bridge fault , store fault , delay fault , etc . testing methods based on voltage testing mainly aim at stuck - at fault model and have also obtained satisfactory result in research for many years . bridge fault is tested easily by quiescent power supply current ( iddq ) testing method . in regard to stuck - open fault that is difficult to testd by quiescent power supply current ( iddq ) and voltage testing , it can is tested by the dynamic current ( iddt ) testing
为了便于测试,我们将生产过程中集成电路出现的多种多样的缺陷抽象为各种模型。目前常用的故障模型主要有:固定故障,开路故障,桥接故障,存储故障,时滞故障等。电压测试主要针对固定型故障模型,多年的研究也取得了令人满意的结果; cmos电路中的桥接故障则宜用稳态电流测试方法( iddq )测试;对于电压和稳态电流难以测试的开路故障,可以使用瞬态电流测试( iddt )的方法进行测试。 |
- Similar Words：
- "open faced" English translation, "open fair" English translation, "open fair and impartial manner" English translation, "open fair transaction tax" English translation, "open fastener" English translation, "open fault locator" English translation, "open feed system" English translation, "open feed water heater" English translation, "open feeder" English translation, "open feel" English translation
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