Influence of irradiation on oxide film reliability in mos structure 结构氧化硅薄膜可靠性的影响
2.
Study on the electric characteristics and radiation response of 6h - sic mos structure 结构电特性及其辐照效应的研究
3.
The study shows that coulomb scattering becomes more important at low transverse - electric field and both the density and the distribution of charged - centers play an important role in el ectron transport in sic inversion layers . the radiation response and electric characteristics of 6h - sic mos structure is studied with experiment for the first time 在实验上首次对6h sicmos结构的电特性及其辐照引起的电参数退化进行了研究，结果说明：在氧化层电场较高时是fowler nordheim隧穿电流决定着sicmos结构的漏电流。
