| 1. | The components , microstructure , luminousness , thickness and surface topography of the films were analysised via xrd , uv ? vis , xps , ellipsometric examination and stm . the photocatalytic properties of these fims are characterized by the decomposition rate of methylene blue or rhodamine b . the effect of sputtering power , temperature , o2 mass flow , bias , w - doping and sputtering time on photocatalytic properties are discussed
采用x射线衍射仪、紫外-可见光分光光度计、 x光电子能谱仪、薄膜厚度测试仪及扫描探针显微镜等测试手段,研究分析了薄膜的组分、结构、透光率、膜厚和表面形貌等。 |
