| 1. | The ammonium tungstate igniting gravimetric method for the determination of tungsten trioxide content
钨酸铵灼烧法测定三氧化钨量 |
| 2. | Method for the determination of tungsten trioxide content in ammonium paratungstate for import export
进出口仲钨酸铵中三氧化钨含量的测定 |
| 3. | Preparation and characterization of ultrathin ordered molecular deposition films of wo3 and bis - quarternary ammonium salt
三氧化钨与双季铵盐超薄有序分子沉积膜的制备及其结构研究 |
| 4. | Spectroelectrochemical measurements were performed in order to obtain the coloration efficiencies of both woj and pani thin films
三氧化钨以及聚苯胺薄膜的著色效率可由光谱电化学的量测获得。 |
| 5. | Methods for chemical analysis of tin concentrates determination of tungsten trioxide content - the thiocyanate spectrophotometric method
锡精矿化学分析方法三氧化钨量的测定硫氰酸盐分光光度法 |
| 6. | Methods for chemical analysis of tungsten concentrates - the ammonium tungstate igniting gravimetric method for the determination of tungsten trioxide content
钨精矿化学分析方法钨酸铵灼烧法测定三氧化钨量 |
| 7. | Firstly , the mechanism of hydrogen response and developmental actuality were summarized in brief . secondly , preparative methods and main materials , instrumentation , technological process were introduced in detail
首先简要概述了三氧化钨掺杂薄膜的氢敏机理及发展现状,其次详细介绍了掺杂薄膜的制备方法、使用的材料设备及工艺流程。 |
| 8. | To test the validity of the model , hybrid inorganic / organic complementary ecd , comprising a tungsten oxide ( wo3 ) and polyanilinc ( pani ) thin film couple in combination with a proton - conducting polymer electrolyte , is studied
为了要测试这个模型是否准确，对混合有机以及无机物的互补式电致色变元件进行研究，结合三氧化钨和聚苯胺薄膜与导氢离子高分子电解质构成一互补式电致色变元件。 |
| 9. | Tungsten oxide film material is a important functional material . it is studied and applied extensively because of its electrochromic property , gasochromic property , photochromic property , electrochemistry , etc . especially gasochromic property is applied to gas sensors extensively
三氧化钨( wo3 )薄膜是一种重要的功能材料,因具有良好的电致变色、气致变色、光致变色、电化学性能而得到广泛的研究和应用,尤其是其气致变色性能在气体传感器方面有广阔的应用前景。 |
| 10. | The tungsten oxide films with catalyst by two methods were characterized by x - diffractometer , tunnel scan - atomic force microscope , ft - ir , double - beam uv - vis - nir spectrophotometer and speediness volt - ampere cycle meter . as results of x - diffractometer , pt / wo3 sputtered film samples are crystal when annealed at 400 with distinct diffractive acuti - apices
本文分别用x衍射仪、隧道-原子力显微镜、傅立叶变换红外光谱仪、双束紫外可见分光光度计、快速伏安循环法等表征了用以上两种方法制备的三氧化钨掺杂薄膜。 |
