Semiconductor devices - mechanical and climatic test methods - part 30 : preconditioning of non - hermetic surface mount devices prior to reliability testing 半导体器件.机械和气候试验方法.第30部分:可靠性试验之前不气密的表面安装器件的预调试
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Semiconductor devices - mechanical and climatic test methods - part 30 : preconditioning of non - hermetic surface mount devices prior to reliability testing 半导体器件.机械和气候试验方法.第30部分:可靠性试验之前不气密的表面安装器件的预调试
