| 1. | Aes analysis of optoelectronic materials
光电材料的俄歇电子谱分析 |
| 2. | Standard guide for depth profiling auger electron spectroscopy
俄歇电子能谱术深度剖析标准导则 |
| 3. | Simulation and numerical reconstruction of auger electron holography
俄歇电子全息的计算机模拟研究和数值重现 |
| 4. | Auger electron energy spectrometer
俄歇电子能谱仪 |
| 5. | Scanning auger microprobe
扫描俄歇电子微探针 |
| 6. | Auger electron spectrometer
俄歇电子能谱仪 |
| 7. | Auger electron spectroscopy
俄歇电子能谱法 |
| 8. | Auger electron image
俄歇电子象 |
| 9. | Standard guide for identifying chemical effects and matrix effects in auger electron spectroscopy
在俄歇电子谱法中测定化学效应和基质效应 |
| 10. | Standard guide for minimizing unwanted electron beam effects in auger electron spectroscopy
俄歇电子光谱仪中干扰电子束效应最小化的标准指南 |
