| 1. | Test procedures for semiconductor x - ray energy spectrometers
射线能谱仪的测试方法 |
| 2. | Standard test procedures for semiconductor x - ray energy spectrometers
半导体x射线能谱仪的标准试验程序 |
| 3. | X - ray energy spectrometr , x
射线能谱仪 |
| 4. | Standard test procedures for semiconductor x - ray energy spectrometers ; amendment 1
半导体x射线能谱仪的标准试验程序.第1次修改 |
| 5. | Gamma ray spectrometer
射线能谱仪 |
| 6. | Measurement procedures for semiconductor x - ray detector system and semiconductor x - ray energy spectrometers
半导体x射线探测器系统和半导体x射线能谱仪的测量方法 |
| 7. | The bioactivity of the anodized substrate is evaluated when it is subjected to alkali and heat treatment to form a sodium titanium hydrogel and bonelike apatite on the surface of titanium alloys in simulated body fuild ( sbf ) with ion concentrations near ly equal to those of human blood plasma
借助扫描电镜、 x射线衍射仪、俄歇电子能谱仪和x射线能谱仪，对氧化钛膜的结构、阻止离子释放作用、表面活性骨质磷灰石的形成及结合强度进行了较为系统的研究。 |
| 8. | The commonly seen gold - carrying minerals in hard - to - leach gold ores - pyrite and arsonpyrite were used in the experiment . through sweep electron microscope ( sem ) and energy dispersive x - ray spectrometer ( edx ) , the change law of the shape and appearance characteristics of the gold - carrying minerals under the mechanical activation function of drum grinding and other activation function were studied so as to provide a reliable basis for the study on the mechanism of the effect of mechanical activiation on the intensification of leaching process
采用难浸金矿常见的载金矿物? ?黄铁矿和毒砂做试验，通过扫描电镜( sem )和x射线能谱仪( edx )研究了在滚筒磨的机械活化作用和不同的活化条件下载金矿物形貌特征的变化规律，为弄清机械活化作用强化浸出过程的机理提供了可靠的研究依据。 |
| 9. | Current researches , applications , preparation and structure of si3n4 are summarized in this paper . a new conclusion is drawn that silicon wafer can react with nitrogen at the temperature higher than 1100 and in super - pure nitrogen by direct - nitridation of silicon at the temperature from 800 to 1200 . the prepared silicon nitride samples are tested by xps ( x - ray photoelectron spectroscopy ) , sem ( scanning electron microscopy ) , optical microscopy , xrd ( x - ray diffraction ) and edx ( energy dispersive x - ray analysis )
通过硅片在800到1200各个温度和各种氮气气氛下的氮化处理的实验结果，报道了不同与其他研究者的氮化条件，硅片在氮气保护的热处理中的氮化条件为：高于1100的温度和高纯氮的气氛条件，同时对该氮化硅薄膜进行了金相显微镜、扫描电镜( sem ) 、 x射线衍射仪( xrd ) 、 x射线光电子谱( xps ) 、 x射线能谱仪( edx )和抗氧化性等测试和分析。 |
| 10. | In the present work , the chemical distributing , the microstructure characteristics and the fractorgraphy analysis of metal / metal fgm are studied systematically by using electron probe microstructure analysis ( epma ) , scanning electron microscopy ( sem ) and energy dispersive x - ray analysis ( eds ) . as a result , some ideas about the fabrication are put forward
然后分别应用电子探针( epma ) 、扫描电子显微镜( sem )和x射线能谱仪( eds )对共沉降法制备的w - mo系和w - mo - ti系梯度功能材料的化学成分分布、显微组织和断口形貌特征等进行了较详细的研究。 |
