Txrf surface chemical analysis - determination of surface elemental contamination on silicon wafers by total - reflection x - ray fluorescence spectroscopy 表面化学分析.用总反射x -射线荧光
2.
Surface treatments . anodized aluminium and aluminium alloys . measurement of total reflectivity using a photoelectric reflectometer 表面处理.阳极氧化铝和铝合金.总反射率的测定.用光电反射系数计测量总反射系数
