| 1. | Profilometer - a tool that is used for measuring surface topography
表面形貌剂-一种用来测量晶圆片表面形貌的工具。 |
| 2. | A new profilometer with a dual - frequency laser for measuring the surface roughness with 1 ? nm
级表面粗糙度的双频激光测量系统 |
| 3. | Test method for thickness of fine ceramic thin films - film thickness by contact probe profilometer
精细陶瓷薄膜厚度的试验方法.用接触探针式表面光度计法测定薄膜厚度 |
| 4. | Advanced technical ceramics . methods of test for ceramic coatings . determination of coating thickness by contact probe profilometer
高技术陶瓷.陶瓷涂层的试验方法.通过接触探头轮廓测定仪测定涂层厚度 |
| 5. | Tests relating to pavements . evenness tests . part 3 : determination of longitudinal evennes indexes calculated from profilometer data
路面试验.滑度试验.第3部分:通过表面光度仪数据计算纵向平滑度指数 |
| 6. | Advanced technical ceramics - methods of test for ceramic coatings - part 1 : determination of coating thickness by contact probe profilometer ; german version en 1071 - 1 : 2003
高级工业陶瓷.陶瓷覆层的试验方法.第1部分:用接触式 |
| 7. | Compared with sputter crater depth results measured with surface profilometer , the converted depth results obtained by gd - oes were accurate and credible
辉光光谱定量转化所得深度结果与表面形貌仪刚定相应溅射坑的深度结果对比发现，本方法定量转化深度结果准确可靠。 |
| 8. | In the present dissertation , friction - induced noises emitted by a flat specimen rubbing against another flat specimen or a ball specimen under reciprocating sliding are studied . the detailed observation of the scars is conducted by means of a scanning electrical microscope ( sem ) , laser scanning microscope ( lsm ) , optical microscope and profilometer . the dynamic state variables are analyzed in detail using the discrete wavelet transform
使用电子扫描显微镜( sem ) 、激光扫描显微镜( lsm ) 、光学显微镜和表面轮廓测量仪等设备对摩擦噪声发生的区域进行了详细的观察和分析，运用小波变换技术对摩擦噪声状态下的动力学变量进行了深层次的研究，应用matlab simulink语言对摩擦系统进行了振动动力学仿真，系统地研究了摩擦噪声的形成机理。 |
| 9. | Therefore , in principle the scattering may be predicted from measurements of the surface profile . in this paper the author also discussed nonspecular scattering for mo / si multlayer coated primary and secondary mirrors of the measured schwarzschlid optics based on power spectral density of these mirrors measured by both optical profilometer ( wyko ) and atomic force microscopy ( afm )
因此，我们可以通过检测多层膜反射镜基底的粗糙度来表征多层膜反射镜非镜面散射对光学系统性能的影响，亦即通过检测多层膜反射镜基底的粗糙度调整抛光工艺参数，获得低散射的多层膜反射镜。 |
