| 1. | A further refinement in semiconductor technology is the integrated circuit .
在半导体工艺中，集成电路是一次革新。 |
| 2. | The chip is fabricated by using semiconductor technics and mems technics
芯片利用半导体工艺和mems工艺制作。 |
| 3. | In view of micromation of sensor and mems fabrication processing , mos capacitive oxygen micro - sensor was devised
从传感器微型化方面考虑，结合mems技术和半导体工艺。 |
| 4. | Testing of materials for semiconductor technology ; determination of impurty content in silicon by infrared absorption ; carbon
半导体工艺材料的检验.第2部分:用红外线吸收法测量硅 |
| 5. | Testing of materials for semiconductor technology - determination of defect types and defect densities of silicon epitaxial layers
半导体工艺材料的检验.硅晶体外延层缺陷种类和缺陷密 |
| 6. | Testing of materials for semiconductor technology ; determination of the orientation of single crystals by means of laue back scattering
半导体工艺材料的检验.第3部分:采用劳埃反向散射法测 |
| 7. | Testing of materials for semiconductor technology - determination of impurity content in silicon by infrared absorption - part 1 : oxygen
半导体工艺材料检验.用红外吸收法测量硅的杂质含量 |
| 8. | Testing of materials for semiconductor technology ; determination of etch rates of etching mixtures ; silicium - dioxid coating ; optical method
半导体工艺材料的检验.蚀刻混合剂浸蚀率的测定.第2部 |
| 9. | Testing of materials for semiconductor technology ; determination of etch rates of etching mixtures ; silicium monocrystals ; gravimetric method
半导体工艺材料的检验.蚀刻混合剂浸蚀率的测定.第1部 |
| 10. | Testing of materials for semiconductor technology - test method for particle analysis in liquids - part 1 : microscopic determination of particles
半导体工艺用材料的检验.液体中粒子分析的试验方法 |
