On the design and research of an intelligent conductivity gauge 一种智能型电导率仪的设计与研究
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The cdte films doped te are deposited onto glass substrate by close spaced sublimation . the x - ray diffraction data indicate the pure cdte films are polycrystalline zinc - blende structure with grain orientation predominantly along ( 111 ) direction . the electrical properties of cdte films are investigated by hall effect measurement using the van der pauw method X射线衍射分析表明，纯cdte薄膜是立方闪锌矿结构， （ 111 ）晶面取向生长； hall效应实验测量发现薄膜电阻很高，呈p型电导，面电阻率数量级达1010
