Chinese translation for "层电阻"

layer resistance

Related Translations:

电阻:  (物质阻碍电流通过的性质) resistance; electric resistance (电路中两点间在一定压力下决定电流强度的一个物理量)◇电阻表 ohmmeter; resistance card; ohm gauge

Example Sentences:

	1.	Test method for sheet resistance of gold plating layer 金电镀层薄层电阻测试方法
	2.	Determination for electrical resistivity of dust in layer 粉尘层电阻率测定方法
	3.	Research of the buried layer van der pauw and bar resistor 范德堡和条状结构埋层电阻的测试及研究
	4.	Test method for resistivity of silicon epitaxial layers by area contacts three - probe techniques 硅外延层电阻率的面接触三探针.测试方法
	5.	Test method for measuring resistivity of semiconductor silicon or sheet resistance of semiconductor films with a noncontact eddy - current gage 半导体硅片电阻率及硅薄膜薄层电阻测定非接触涡流法
	6.	The forward calculation shown that when providing current through whole casing pipe , the electrical potential on surface is mainly effected by shallow resistivity anomaly , whereas when providing current only at gun perforation position , the electrical potential is on surface mainly effected by corresponding resistivity of gun perforation position 正演结果表明：在全井套管供电时，地表观测电位主要受浅层电阻率不均匀性的影响；在射孔段供电时，地表观测电位主要反映射孔段的电阻率分布。
	7.	In this paper , the circuit used for testing sheet resistance is designed using single chip processor . additionally , we have expressed van der pauw function as a polynomial form through local and global reversal development by using the normalized polynomial match , being convenient not only for programming , but also for sheet resistance testing when using van der pauw and rymaszewski methods 本文还利用单片机系统设计了薄层电阻测试电路，对于程序中用到的范德堡隐函数，利用非线性反演和规范化拟合的方法推导出其多项式显函数形式。这不仅给对我们编写程序提供了方便，也为使用范德堡法和rymaszewski法测量薄层电阻提供了便利。
	8.	The experimental instruments , apparatus and the means to prepare all the samples are introduced in the first section . in section 2 , the experimental system including the oxidization system and diffusion system , are introduced therein . in section 3 , the samples preparation including the pre - deposition , redistribution and re - oxidization , the samples of b doping , and the fabrication of ga - diffusion transistor , b - diffusion and the transistor formed by b diffusion following ga diffusion are detailed therein , and the as - prepared samples are analyzed by sims , srp and four point probe 首先介绍了制备各种样品所用的实验仪器、设备与方法；第二节中介绍了实验系统，包括氧化系统、扩散系统，第三节介绍了样品的制备，包括ga的预沉积、再分布、二次氧化样品，扩硼样品，以及扩嫁晶体管、扩硼晶体管和扩镰后再补充扩硼晶体管的制备流程；实验所得样品，借助二次离子质谱（ sims ） 、扩展电阻（ srp ） 、四探针薄层电阻等先进的测试分析方法进行分析。
	9.	At present , the problem in testing sheet resistance for micro - areas is that probes must be set up at the suitable locations by handwork . in order to know the wafer ' s impurity distributing , we need test many times , so will waste a lot of time . if the wafer ' s diameter would be 300mm , this problem will be more serious . in this paper , image analysis is introduced , through pre - processing and edge picking - up , the probe tips are recognized . then probe tips will be aligned respectively in two perpendicular directions through driving stepper motors . thus the distribution of sheet resistance for whole wafer is got by automatic testing and it offers information for detecting the impurity distribution and the diffusion uniformity 这样，完成200mm ( 8时)圆片杂质的扩散分布需要对许多图形进行测试，需要花费很长的时间，当测试300mm硅片时问题就更为突出。本文将图象与视觉测量系统引入四探针测试系统中，对采集到的原始探针图像进行预处理、边缘提取等操作，以便实现探针针尖的识别，然后由电机控制实现探针的自动定位。这样测试系统可以自动获得全片的薄层电阻分布，为超大规模集成电路检测杂质分布和扩散的均匀性提供信息。

Similar Words：

"层递技术" Chinese translation, "层递迁移" Chinese translation, "层电荷" Chinese translation, "层电子" Chinese translation, "层电子俘获" Chinese translation, "层电阻率" Chinese translation, "层淀积层母质层" Chinese translation, "层碟式汽提塔" Chinese translation, "层迭" Chinese translation, "层迭菜单" Chinese translation