| 1. | Linearly polarized light will in consequence become elliptically polarized on total reflection .
因此，线偏振光径全反射后将变成椭圆偏振光。 |
| 2. | All the other wavelengths will emerge as either elliptically or circularly polarized light .
所有其它波长的光将以椭圆偏振光或圆偏振光出射。 |
| 3. | When the end of the electric field vector travels in an ellipse, the light is elliptically polarized .
电场矢量的末端沿一椭圆移动的光叫椭圆偏振光。 |
| 4. | Orientation of the elliplically polarized light ' s main axis
椭圆偏振光主轴方向的确定 |
| 5. | The method of data processing for directly demonstrating elliptically polarized light experimentally
椭圆偏振光直接实验验证的数据处理方法 |
| 6. | The deposited cu - mgf2 cermet films were analyzed by xrd , ed , tem , ir , uv , ellipsometry and temperature - varied four - wire technique
用ir 、 uv及椭圆偏振光谱技术测量分析样品从红外-近紫外波段的透射、吸收及反射光谱特性。 |
| 7. | For detecting elliptically polarized light and partially polarized light , the detection method is analyzed frow the view of the composite retardation plate theory
摘要为了检测部分偏振光与椭圆偏振光，从复合波片的理论出发，借助于数学工具，对检测方法做了较为详尽的理论分析。 |
| 8. | We compare the theoretical results with the experimental results and discuss the applicability of the three effective medium theories to nanoparticles cermet films
我们将理论计算结果同用椭圆偏振光谱仪得到的实验值进行了比较，讨论了三种有效介质理论对不同微结构薄膜体系的适用性。 |
| 9. | Analysis th to mechanism ellipse polarized light that in the specimen faced happen at the same time reflection refraction and multiplicity light beam interference , proves the principle that laser instrument of measure thickness of specimen with jones vector
摘要对椭圆偏振光在样品表面产生的反射、折射和多光束干涉的机制进行了分析，并用琼斯矢量论证了激光测厚仪的原理。 |
| 10. | The results indicate any elliptically polarized light can be compensated to become lineally polarized light throught / 4 wave - plate as long as the fast - axis ( slow - axis ) of / 4 wave - plate and the long - axis ( short - axis ) of elliptically polarized light are in the same orientation , but partially polarized light cann ' t
结果表明，只要/ 4波片的快（慢）轴与椭圆偏振光的长（短）轴方位一致，则任何椭圆偏振光经过/ 4波片后均可以补偿为线偏振光，而部分偏振光经过/ 4波片后仍为部分偏振光。 |
