| 1. | Structure you can test the structure
可以使用下面的代码测试结构 |
| 2. | Improved scan forest architecture
改进的扫描森林测试结构 |
| 3. | Design and simulation of on - line test structure for thermal conductivity of polysilicon thin films
在线检测多晶硅薄膜热导率测试结构的设计与模拟 |
| 4. | Jx5 microprocessor ’ s testing structure comprises built - in self - test ( bist ) , boundary scan and internal scan
Jx5微处理器的测试结构由bist 、边界扫描和内部扫描三部分组成。 |
| 5. | This method requires only very readily available test equipment and occupies very small area of th e chip , so it can be used in mems process and in - situ monitoring
这种测试结构非常简单，占用很少的芯片面积，适用于通常mems加工工艺的在线监测。 |
| 6. | Are the result reproducible , can they be verified ? do the anti - virus vendors get the miss samples after the test in order to be able to verified the results
测试结构具有可再生性吗?可以被验证吗？反病毒厂家有在测试之后得到缺失样本来进行结果验证吗？ |
| 7. | At last , combining the analysis of performance parameters about obs , an implement method for the hardware evaluation system of obs is introduced , which is
最后,结合对obs系统性能指标的研究,在分析当今的研究现状之后建立了一种基于bhp的硬件测试结构。 |
| 8. | The first is the influence of obs to the traffic flow ; the second is the influence of traffic flow to performance of obs ; the third is research and experiment of the hardware evaluation system of obs
主要分为三个部分:一是对obs交换结构中的业务流特性的研究;二是对业务流特性对obs交换结构性能的影响的研究;三是对obs硬件测试结构的研究和尝试。 |
| 9. | Abstract : metal aluminium film em failure mechanism has been studied under pulsed stress , and the metal aluminium em reliability under pure ac stress has been discussed , a detailed spec - ification has been made about relative factor affecting test structures
摘要：对脉冲应力作用下金属铝膜的电迁移失效机理进行了研究，研究了纯交流应力对金属铝膜电迁移可靠性的影响，对影响测试结构的相关因素作了详细的描述。 |
| 10. | This paper mainly accomplished the following research : summarize the classify and application fields of four - probe testing technology ; take the square four - probe testing technology study by using the advantage of rymaszewski method in auto - eliminating the portrait wandering influence to induct ry method to square - probe testing method ; deeply study the influence of probe wandering to progressed ry method testing result ; complete the design of testing panel and testing circuit , realize the auto - testing of mono crystal wafer ; discuss the image enhancement and threshold selection problem in image identify , and finally accomplish the identify of probe pinpoint . the main new view points of the research : 1 . it is the first time for applying image manipulation and analysis technique to the sheet resistance measurement , and achieving the auto - location function of the probe
为此，本文开展了以下研究工作：综述了四探针技术的分类以及应用范围；对方形四探针测试技术进行了研究，利用rymaszewski法自动消除探针纵向游移影响的优点，将它应用于方形探针测试法中，并对探针游移对改进rymaszewski法测试结果的影响进行了深入探讨，提出了用图像识别技术监测测试进行的方法；完成了测试系统的测试平台以及测试电路的设计，研制出具有图像识别功能的斜置式方形探针分析仪一台，实现了硅片电阻率测试的自动化；对图像识别过程中涉及到的图像增强和阈值选择问题进行了论述，最终实现了对探针针尖的图像识别以及探针测试结构的自动调整，保证了方形探针测试仪的测试精度。 |
