Chinese translation for "芯片测试"

chip testing

Related Translations:

磊芯片:  led epi wafer

晶体管芯片:  transistor chip

芯片处理:  chiprocessingdie processingwafer processing

芯片编号:  chip number

芯片数量:  chicountcount, chip

芯片粘贴:  die bonding

测试芯片:  test chiptest die

微芯片:  microchip

芯片操作系统:  cos chioperation system

性格芯片:  personality chips

Example Sentences:

	1.	Bluetooth headset main chip testing f 蓝牙耳机主芯片测试架
	2.	Test results show an excellent performance of the chip 芯片测试结果显示芯片性能优异,达到预期的设计要求。
	3.	Study on test control for system - on - a - chip based on test data slicing 基于数据切片的系统芯片测试控制技术研究
	4.	To debug on the hardware , eliminate circuitry errors , and test on every chip . 3 对板卡硬件调试，线路排错，芯片测试； 3
	5.	Because the truly characteristic of random numbers ca n ' t be proved by testing the chip , it ' s very important to guarantee it in the theory 由于随机数的真随机性不可能在芯片测试时得到证明，因此在理论上保证它的真随机性显得尤为的重要。
	6.	Test results show that this adc achieves the snr of 90 db and distortion ratio of 0 . 0248 % for a 20khz signal bandwidth while operating under a single 3 . 3v supply 芯片测试结果显示其信噪比达到90db ,总谐波失真0 . 0248 % ,基本达到了预期的设计指标。
	7.	The testing of the chip is faced with very serious challenge , the cost of testing is always rising , and even larger than the designing and manufacturing cost 芯片测试遇到了前所未有的挑战，测试费用越来越高，出现了设计、生产费用与测试费用倒挂的局面。
	8.	Based on that , the author simulated most of the sub - block circuits and whole chip circuit by applying eda tools hspice . the simulation results indicate that the ic has achieved the expectation , 理论分析、仿真结果和芯片测试数据表明,在典型情况下,该电路的电流控制精度相对误差和匹配相对误差可以控制在0 . 5 %以内,达到了预定设计目标。
	9.	With the sharp development of lsi and vlsi , the integration of chip gets denser and denser . but the extra ports for testing is limited and test is more difficult than before . we even must spend more time and money on chip testing rather than chip design 大规模集成和超大规模集成电路迅速发展，使芯片的集成度越来越高，而供外部测试的引脚却很少，测试问题日趋困难，甚至使芯片测试比芯片本身的设计和生产要付出更高的代价。
	10.	We aslo get the theory of verification test and design debug discussed , and then , some work on the verification test of this integrated circuits have been done . for the sake of finding out the reason of noise occurring in circuit of oscillator , we probe into causation of technics and mechanism 论文最后基于芯片测试理论,针对芯片流片后的部分测试结果,对振荡出现的噪声问题给出了初步分析,并结合投片工艺探讨了工艺原因与产生机理。

Similar Words：

"芯片布局" Chinese translation, "芯片布置布线图" Chinese translation, "芯片布置网" Chinese translation, "芯片材料" Chinese translation, "芯片操作系统" Chinese translation, "芯片插座" Chinese translation, "芯片成品率" Chinese translation, "芯片承载器" Chinese translation, "芯片尺寸" Chinese translation, "芯片尺寸封装" Chinese translation