| 1. | The dependency of tic content versus relative intensity of x - ray diffraction peak was also studied
K值法研究确定了tic含量与xrd衍射峰相对强度的关系。 |
| 2. | One diffraction peak of the secondary phase was found in the xrd spectrum of sample annealing at 850 for 15s
在850 + 15s退火处理的样品中发现了第二相形成的衍射峰。 |
| 3. | It is verified that the oxide have obvious characteristic diffraction peaks and less impurity by x - ray diffraction ( xrd )
X射线衍射( xrd )分析表明,制备出的氧化物样品特征衍射峰明显,杂质含量少。 |
| 4. | The surface of the particles , however , from cyclohexane looks more smooth and denser than that of the particles from xylene . in addition , the stirri
Xrd结果表明复合物无明显的峰形出现，经过高温灼烧除去有机物后，出现了特征的la （ oh乃的衍射峰。 |
| 5. | For the first time , we obtain a ( 002 ) orientated high quality zno thin films with the full width at half maximum ( fwhm ) of 0 . 2o located at 34 . 42o at a low temperature of 180
首次报道了用这种方法在衬底温度为180oc条件下制备了（ 0002 ）择优取向，其x -射线衍射峰的半峰宽为0 . 2度的高质量氧化锌薄膜。 |
| 6. | The diffraction peak angle does n ' t change obviously as co / fe ratio , it is attributed to the radius of co fe ions are fairly similar , so the influence of substitutions on unit cell is small
而随着co fe比的变化，衍射峰角度值变化不明显，这是由于co 、 fe离子半径相差不大，它们之间的位置取代对晶胞的整体影响相对较小。 |
| 7. | The x - ray diffraction analysis of the compound powder showed that the value of the diffraction peak reduced , the breadth of the diffraction peak broadened . there was incrystallizing to a certainty degree of the compound powder
粉末的x - ray衍射分析表明，粉末的衍射峰峰值降低，峰增宽，粉末体系产生了一定程度的非晶化。 |
| 8. | The relationships between the substrate temperature and the properties of zno films were studied in detail , we obtained a ( 002 ) orientated high quality zno thin films with the full width at half maximum ( fwhm ) of 0
用这种方法在衬底温度为180条件下制备了( 0002 )择优取向， x -射线衍射峰的半高宽为0 . 2度的高质量氧化锌薄膜。 |
| 9. | This work was initiated to establish an in - situ xrd measuring system through which the variations of xrd peak intensities on the surfaces of plzt ferroelectrics with fatigue numbers during an electric process can be in - situ observed
本工作通过建立原位xrd观测系统，对电疲劳过程中plzt铁电陶瓷试样表面x射线衍射峰随疲劳次数的变化进行了原位观测。 |
| 10. | And then , we measured x - ray diffractive spectrum of samples and investigated the crystal lattice structure of samples treated under different annealing temperature and different implantation condition comparing the diffraction peaks
然后，通过x射线衍射测量了样品的衍射谱，通过比较不同样品衍射峰的形状，了解了不同退火温度及注入条件下样品的晶格结构情况。 |
