| 1. | Deposition temperature and surface microstructures zro
2薄膜结构及表面形貌的影响 |
| 2. | Surface measurement using a 2 - d ronchi ruling
基于二维朗奇光栅的表面形貌测量 |
| 3. | Measurement of device surface profile and roughness
器件表面形貌及粗糙度检测 |
| 4. | Applications of geometrical optical stylus
几何光探针在表面形貌测量中的应用 |
| 5. | Surface topography character of sandwich compound machining
夹心式复合加工表面形貌特征 |
| 6. | Effects of silicon surface morphology on protein chelating
硅片载体表面形貌对蛋白质吸附的影响 |
| 7. | The computation methods of the fractal dimension of surface profiles
表面形貌分形表征方法的比较 |
| 8. | To describe the surface appearance of mark by fractal method
应用分形方法描述痕迹表面形貌的探索 |
| 9. | Phase composition and surface morphology of tic coating by chemical vapor deposition
涂层的相组成和表面形貌 |
| 10. | Characterization of surface topography during running - in process with fractal parameter
磨合表面形貌变化的分形表征 |
