| 1. | These features are examined by optical microscopy, scanning electron microscopy, and transmission electron microscopy .
这些图形可以用光学显微镜，扫描电子显微镜和透射电子显微镜来观察。 |
| 2. | Analysis and trouble shooting of h - 7500 tem
7500透射电子显微镜故障检修实例分析 |
| 3. | Test method for the transmission electron microscope
透射电子显微镜试验方法 |
| 4. | Scanning transmission electron microscopy stem
扫描透射电子显微镜 |
| 5. | The filament circuit analysis and wrong check of the tem
透射电子显微镜灯丝电路分析和故障检修 |
| 6. | Popular transmission electron microscope
普及型透射电子显微镜 |
| 7. | Simple transmission electron microscope
简易型透射电子显微镜 |
| 8. | The simplified analysis of the aberration of the transmission electron microscope
透射电子显微镜像差的简化分析 |
| 9. | Method of selected area electron diffraction for transmission electron microscopes
透射电子显微镜选区电子衍射分析方法 |
| 10. | The sizes and shapes of particles were examined by tem
用透射电子显微镜观测了粒子的大小及形貌，并探讨了摘要其影响因素。 |
